The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2010

Filed:

Aug. 01, 2006
Applicants:

Joseph Lee Smith, Fuquay Varina, NC (US);

Alain Granger, Raleigh, NC (US);

Inventors:

Joseph Lee Smith, Fuquay Varina, NC (US);

Alain Granger, Raleigh, NC (US);

Assignee:

Alcatel Lucent, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 14/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Optical Time-Domain Reflectometer (OTDR) troubleshooting of a passive optical network (PON) can be enhanced by deploying cascaded splitters, at least some of which have multiple inputs. That is, at least some of the splitters in the PON have not only a first input coupleable to the optical line terminator (OLT) or output of another splitter but also a second input directly coupleable to an Optical Time-Domain Reflectometer (OTDR). Optical time-delay reflectometry can be performed upon a selected portion or segment of the PON by selecting a splitter and transmitting an optical test signal from the OTDR directly to the input of the selected splitter and analyzing the reflected signal.


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