The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2010
Filed:
Sep. 03, 2004
Werner Weiershausen, Eppertshausen, DE;
Arnold Mattheus, Darmstadt, DE;
Ralph Leppla, Darmstadt, DE;
Yutaka Miyamoto, Tokyo, JP;
Akira Hirano, Tokyo, JP;
Yoshiaki Kisaka, Tokyo, JP;
Werner Weiershausen, Eppertshausen, DE;
Arnold Mattheus, Darmstadt, DE;
Ralph Leppla, Darmstadt, DE;
Yutaka Miyamoto, Tokyo, JP;
Akira Hirano, Tokyo, JP;
Yoshiaki Kisaka, Tokyo, JP;
Deutsche Telekom AG, Bonn, DE;
Nippon Telegraph and Telephone Corporation, Tokyo, JP;
Abstract
The present invention proposes a method whereby during a specified/specifiable observation period (T) , the polarization states of optical transmission system and/or the optical signals transmitted by the optical transmission system are changed by applying a targeted intervention in at least one position of the transmission line, and at a second position which is interposed at least one place downstream from the first position of the optical transmission line, a specified/specifiable signal characteristic (BER) is qualitatively measured and checked for adherence to a specified/specifiable threshold condition (BER) and the PMD-induced outage probability of the optical transmission system is calculated on the basis of the ratio between the length of that share of the time (T), during which the measured signal characteristic fails to meet the threshold condition (BER), to the length of the observation period (T).