The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2010
Filed:
Mar. 01, 2006
Applicants:
Hani K. Muammar, Green Lane, GB;
Nicholas P. Murphy, London, GB;
Inventors:
Hani K. Muammar, Green Lane, GB;
Nicholas P. Murphy, London, GB;
Assignee:
Eastman Kodak Company, Rochester, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01); H04N 9/64 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus for processing defects in a digital image include defining a defect map, having defect and non-defect entries, as a defect bounded by an expanded defect region and an outer analysis region of a different defect map values. By choosing suitable values and performing a bitwise logical OR operation on the entries the processing of the defect map is made more efficient.