The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2010
Filed:
Feb. 21, 2006
Toshihiro Moriya, Nara, JP;
Hirotaka Wada, Nara, JP;
Takako Onishi, Kyoto, JP;
Atsushi Shimizu, Yokohama, JP;
Akira Nakajima, Otsu, JP;
Toshihiro Moriya, Nara, JP;
Hirotaka Wada, Nara, JP;
Takako Onishi, Kyoto, JP;
Atsushi Shimizu, Yokohama, JP;
Akira Nakajima, Otsu, JP;
OMRON Corporation, Kyoto, JP;
Abstract
A PC board inspecting method capable of detecting deviation of an IC component at high speed with small storage capacity utilizes inspection logic particular to a component to be inspected. The inspection logic includes a color condition for specifying a color appearing in the body of the component to be inspected. The component is radiated with a plurality of color rays at different angles of incidence. An image formed by reflection light of the color rays is captured, and an inspection image including at least part of an edge of the body of the component to be inspected is captured. By using the color condition, a component body area satisfying the color condition is extracted from the inspection image by an image process.