The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2010

Filed:

Apr. 18, 2006
Applicants:

Jong Gook Ko, Daejeon, KR;

Youn Hee Gil, Daejeon, KR;

Jang Hee Yoo, Daejeon, KR;

Kyo IL Chung, Daejeon, KR;

Inventors:

Jong Gook Ko, Daejeon, KR;

Youn Hee Gil, Daejeon, KR;

Jang Hee Yoo, Daejeon, KR;

Kyo Il Chung, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of iris recognition using a cumulative-sum-based change point analysis and an apparatus using the same are disclosed. The method includes: transforming an iris image to a polar coordinated image having n×m pixel size and dividing the polar coordinated image into at least one cell; grouping the divided iris images into at least one of first groups having a predetermined number of cells, and at least one of second groups each having more cells than the first group has; performing a cumulative-sum-based change point analysis using a predetermined characteristic pattern value of each cell as a representative value; and generating a pattern vector by assigning a predetermined value to a cell having the change point and assigning a different value to other cells.


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