The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2010
Filed:
May. 03, 2005
Todd D. Newman, Palo Alto, CA (US);
John S. Haikin, Fremont, CA (US);
Todd D. Newman, Palo Alto, CA (US);
John S. Haikin, Fremont, CA (US);
Canon Kabushiki Kaisha, Tokyo, JP;
Microsoft Corporation, Redmond, WA (US);
Abstract
A method and apparatus for generating transform-based color profiles by a measurement-based Color Management System (CMS). The measurement-based CMS generates the transform-based profile wherein the measurement-based color system is parameterized by color data and procedures. The CMS may use a reference Profile Connection Space (PCS) loaded from a measurement profile, thus enabling user configuration of the generation process. The reference PCS may also be set to include a gamut that is appropriate for an eventual color-output device. In addition, a Gamut Mapping Model (GMM) used in the generation process is user-selectable as well as a Device Model (DM). The DM may also be supplied as a pluggable module. The CMS also features user-selectable mapping from an International Color Consortium (ICC) intent to a PCS profile and to a DM. The features of the CMS may be used in an application, stand-alone profiling tool or in an operating system utility.