The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2010
Filed:
Apr. 28, 2006
Tatsuya Nakano, Nagano-ken, JP;
Masahiko Yoshida, Nagano-ken, JP;
Keigo Yamasaki, Tokyo, JP;
Seiko Epson Corporation, Tokyo, JP;
Abstract
A method for measuring density, includes: forming on a medium a pattern that consists of a plurality of dot rows formed respectively in a plurality of row regions lined up in a direction intersecting a movement direction in which a plurality of nozzles move, by forming each of the dot rows in the row region arranged in the movement direction by ejecting ink from the nozzles; reading the pattern by a scanner; measuring density of each of the row regions of the read pattern; calculating respective modification values corresponding to each of the row regions, based on at least a part of a measurement result of the density of the plurality of the row regions; and modifying respective measured values of the density of each of the row regions based on the respective modification values corresponding to each of the row regions.