The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2010
Filed:
Jan. 23, 2007
Applicants:
Michael A. Popp, Neumarkt, DE;
Guenther Bonn, Zirl, AT;
Christian W. Huck, Innsbruck, AT;
Inventors:
Assignee:
Bionorica AG, Neumarkt, DE;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/42 (2006.01); G01N 21/35 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method is provided for characterizing a scientific material, such as a silicate material, a polymer material and/or nanomaterial. The method can include the steps of irradiating a measuring light of a predetermined wavelength range into material specimens, recording the measuring light reflected and/or reemitted by the material specimens, determining a ratio depending on the wave lengths of irradiated to detected measuring light (spectrum), and numerical-mathematical processing of spectral data of single material specimens for determining the characteristic features of the material specimens.