The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2010

Filed:

Mar. 02, 2006
Applicants:

Klaus Lehre, Malsch, DE;

Oliver Wackerl, Kirchheim an der Teck, DE;

Joerg Hilsebecher, Hildesheim, DE;

Joachim Hauk, Renningen-Malmsheim, DE;

Martin Reiche, Weil der Stadt, DE;

Martin Randler, Immenstaad, DE;

Ruediger Jordan, Stuttgart, DE;

Inventors:

Klaus Lehre, Malsch, DE;

Oliver Wackerl, Kirchheim an der Teck, DE;

Joerg Hilsebecher, Hildesheim, DE;

Joachim Hauk, Renningen-Malmsheim, DE;

Martin Reiche, Weil der Stadt, DE;

Martin Randler, Immenstaad, DE;

Ruediger Jordan, Stuttgart, DE;

Assignee:

Robert Bosch GmbH, Stutttgart, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/32 (2006.01); G01S 13/42 (2006.01); G01S 13/50 (2006.01); G01S 13/00 (2006.01); G01S 13/93 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and device are provided for measuring distance and relative speed of a plurality of objects with the aid of an FMCW radar, transmitted signals being reflected by objects, and the reflected signals being received and mixed with the transmitted signals. A combination of distance and relative speed values is assigned to the mixer output frequencies of each frequency ramp for each object, and the distance and relative speed of a possible object are determined from points of intersection of a plurality of distance and relative speed combinations. The apparent (unreal) objects are eliminated by modifying the frequency slope of at least one frequency ramp according to the random principle in a subsequent measurement cycle.


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