The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7714291 B1

PDF
Full Text
Expired
Date of Patent:
May. 11, 2010

Filed:

Jul. 07, 2006
Applicants:

Kris Filip Johan Jules Thielemans, London, GB;

Charalampos Tsoumpas, London, GB;

Inventors:
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/161 (2006.01);
U.S. Cl.
CPC ...
Abstract

The method calculates a scatter estimate for annihilation photons in a subject having a distribution of attenuation. The method can be used for scatter correction of detection data from a positron emission tomographic scanner. The method uses the following steps: —select a first scatter point Sand a second scatter point S, —determine a first scatter probability for scattering of a photon at scatter point Sand a second scatter probability for scattering of a photon at scatter point S, —determine an integral of the attenuation over a line connecting Sand S, —multiply the integral and the scatter probabilities and use the product in the calculation of the scatter estimate.


Find Patent Forward Citations

Thielemans, Kris Filip Johan Jules. (2010). Method of and software for calculating a scatter estimate for tomographic scanning and system for tomographic scanning (U.S. Patent No. 7714291). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7714291

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…