The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2010
Filed:
Sep. 09, 2005
Ute Resch-genger, Berlin, DE;
Dietmar Pfeifer, Berlin, DE;
Christian Monte, Berlin, DE;
Angelika Hoffmann, Berlin, DE;
Pierre Nording, Gams SG, CH;
Bernhard Schönenberger, Azmoos SG, CH;
Katrin Hoffmann, Berlin, DE;
Monika Spieles, Berlin, DE;
Knut Rurack, Berlin, DE;
Ute Resch-Genger, Berlin, DE;
Dietmar Pfeifer, Berlin, DE;
Christian Monte, Berlin, DE;
Angelika Hoffmann, Berlin, DE;
Pierre Nording, Gams SG, CH;
Bernhard Schönenberger, Azmoos SG, CH;
Katrin Hoffmann, Berlin, DE;
Monika Spieles, Berlin, DE;
Knut Rurack, Berlin, DE;
BAM Bundesanstalf fur Materialforschung und - prufung, Berlin, DE;
Fluka GmbH, Buchs, CH;
Abstract
The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra I(λ), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra I(λ) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMof their bands of at least 1400 cm. According to the method of the invention, partial correction functions F(λ) are generated by forming the quotient of the measured fluorescence spectra J(λ) and the corresponding corrected fluorescence spectra I(λ), which are then combined to form a total correction function F(λ) for a broad spectral range. The combination factors αare hereby computed by statistical averaging of consecutive partial correction functions F(λ) over only a predefined, limited overlap region λ±Δλabout the mutual crossover wavelength λ.