The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2010
Filed:
Feb. 18, 2002
Nobuyuki Hayashi, Tokyo, JP;
Nobuyuki Hayashi, Tokyo, JP;
Kirin Beer Kabushiki Kaisha, Tokyo, JP;
Abstract
A method of preparing a yeast usable in a fermentation test for evaluating malt on the laboratory scale whereby more reproducible test data can be obtained regardless of the operation conditions of a plant, etc.; and a medium to be used therein. A yeast for the fermentation test for evaluating malt is prepared by culturing a yeast in a liquid medium containing 0 to 2.5% by weight of glucose, 6.0 to 9.0% by weight of maltose, 0 to 2.5% by weight of sorbitol, 0 to 1.0% by weight of peptone and 0.3 to 1.0% by weight of yeast extract at 10 to 20° C. for 2 to 4 days under shaking (primary culture), then in the medium in an increased amount compared with the primary culture at 10 to 20° C. for 3 or 4 days under shaking (secondary culture), then in the medium in a further increased amount compared with the secondary culture at 8 to 9° C. for 7 to 9 days under stirring until the plats attains 3.0° P. or less (tertiary culture), allowing to stand in a cold room for 3 to 24 hours and then collecting the yeast.