The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2010

Filed:

Mar. 10, 2005
Applicants:

Mark Brister, Encinitas, CA (US);

James R. Petisce, San Diego, CA (US);

Sean Saint, San Diego, CA (US);

Kum Ming Woo, San Diego, CA (US);

Victor Ha, San Diego, CA (US);

John Nolting, Poway, CA (US);

Peter C. Simpson, Del Mar, CA (US);

James Brauker, San Diego, CA (US);

Inventors:

Mark Brister, Encinitas, CA (US);

James R. Petisce, San Diego, CA (US);

Sean Saint, San Diego, CA (US);

Kum Ming Woo, San Diego, CA (US);

Victor Ha, San Diego, CA (US);

John Nolting, Poway, CA (US);

Peter C. Simpson, Del Mar, CA (US);

James Brauker, San Diego, CA (US);

Assignee:

DexCom, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01); B05D 3/12 (2006.01); G01N 27/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates generally to systems and methods for measuring an analyte in a host. More particularly, the present invention relates to systems and methods for transcutaneous measurement of glucose in a host.


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