The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2010
Filed:
Mar. 18, 2005
Makoto Nakai, Tokyo, JP;
Sunao Takeda, Ichikawa, JP;
Akihiko Uchiyama, Yokohama, JP;
Kenji Yanashima, Ichikawa, JP;
Akihiro Fujita, Hamamatsu, JP;
Itaru Yoshizawa, Tokyo, JP;
Makoto Nakai, Tokyo, JP;
Sunao Takeda, Ichikawa, JP;
Akihiko Uchiyama, Yokohama, JP;
Kenji Yanashima, Ichikawa, JP;
Akihiro Fujita, Hamamatsu, JP;
Itaru Yoshizawa, Tokyo, JP;
Waseda University, Tokyo, JP;
Kowa Company, Ltd., Aichi, JP;
Abstract
A tonometry device includes a contact device for contacting the object, means for vibrating the contact device and the object, means for applying a voltage to the vibration means, means for measuring a current flowing through the vibration means, and an information processing means. The information processing means determines two resonance points of the device and the measured object by measuring current through the system at a plurality of vibrational frequencies. The information processing means then determines the internal pressure of the object by determining that a first pressure is higher than a second pressure by determining that the first pressure has a lower measured current than the second pressure at frequencies outside of the range of frequencies between the resonance points, and that the first pressure has a higher measured current than the second pressure at frequencies within the range of frequencies between the resonance points.