The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2010

Filed:

Jun. 28, 2005
Applicants:

David Kogan, San Mateo, CA (US);

John R. Ciminski, Redwood Shores, CA (US);

Inventors:

David Kogan, San Mateo, CA (US);

John R. Ciminski, Redwood Shores, CA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A distributed code development environment includes baseline code that is logically divided into a plurality of labels, each including a plurality of transactions authored by respective developers. A computer-implemented method for identifying intermittent errors in the baseline and determining whether errors generated by a test of transactions are intermittent or consistent may include steps of providing the baseline code and providing the plurality of transactions, each of the plurality of transactions including code authored by a developer. A selected test may be carried out on a selected one of the plurality of transactions, the selected test generating an error that represents an unsuccessful completion of the selected test. The generated error may then be compared against errors generated by the selected test on other transactions or labels. The generated error may be identified as intermittent with respect to the transaction and spurious in the baseline if a selected number of errors generated by the selected test on the other transactions or labels are identical or similar to the generated error, according to a selected metric.


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