The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2010

Filed:

Sep. 30, 2003
Applicants:

Brian K. Campbell, Milford, MA (US);

Kendell A. Chilton, Southborough, MA (US);

Christopher S. Maclellan, Walpole, MA (US);

Ofer Porat, Westborough, MA (US);

Inventors:

Brian K. Campbell, Milford, MA (US);

Kendell A. Chilton, Southborough, MA (US);

Christopher S. MacLellan, Walpole, MA (US);

Ofer Porat, Westborough, MA (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An error checking system includes an input device for receiving a data element including parity information; a parity check device for checking the parity information of the data element to determine whether the data element is valid; a CRC generator coupled to the parity check device for generating a CRC for the data element; and an output device for transmitting the data element with the parity information and CRC to a downstream device over a transmission link. The parity check device is operative to output a corruption signal to the CRC generator if the parity check device determines that the data element is invalid, to instruct the CRC generator to corrupt the CRC generation for that data element.


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