The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2010

Filed:

Oct. 07, 2003
Applicants:

Michael G. Bradley, Chesterfield, MO (US);

J. Douglas Gordon, Arlington, VA (US);

Pamela W. Sims, North Arlington, VA (US);

Douglas A. Mcmanus, Bethesda, MD (US);

Morgan C. Snyder, Clifton, VA (US);

Mathew J. Klena, Falls Church, VA (US);

Inventors:

Michael G. Bradley, Chesterfield, MO (US);

J. Douglas Gordon, Arlington, VA (US);

Pamela W. Sims, North Arlington, VA (US);

Douglas A. McManus, Bethesda, MD (US);

Morgan C. Snyder, Clifton, VA (US);

Mathew J. Klena, Falls Church, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods are provided for providing, based on a model, an indication that an appraisal value for a property is likely to be faulty. In one embodiment, a method includes receiving information representative of at least one of a borrower, a property, or one or more demographics, such that the received information corresponds to a date. The method determines a score based on the received information and the model, such that the score provides the indication of the likelihood that the appraisal value was faulty on the date.


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