The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2010
Filed:
Nov. 09, 2005
Miroslaw Bartkowiak, San Jose, CA (US);
Wesley S. Harper, San Mateo, CA (US);
Eray Kulcu, Coztepe/Izmir, TR;
Matthew J. Lesho, San Carlos, CA (US);
Janet A. Tamada, Stanford, CA (US);
Miroslaw Bartkowiak, San Jose, CA (US);
Wesley S. Harper, San Mateo, CA (US);
Eray Kulcu, Coztepe/Izmir, TR;
Matthew J. Lesho, San Carlos, CA (US);
Janet A. Tamada, Stanford, CA (US);
Animas Corporation, West Chester, PA (US);
Abstract
The present invention comprises one or more microprocessors programmed to execute methods for improving the performance of an analyte monitoring device including prediction of glucose levels in a subject by utilizing a predicted slower-time constant (1/k). In another aspect of the invention, pre-exponential terms (1/c) can be used to provide a correction for signal decay (e.g., a Gain Factor). In other aspects, the present invention relates to one or more microprocessors comprising programming to control execution of (i) methods for conditional screening of data points to reduce skipped measurements, (ii) methods for qualifying interpolated/extrapolated analyte measurement values, (iii) various integration methods to obtain maximum integrals of analyte-related signals, as well as analyte monitoring devices comprising such microprocessors. Further, the present invention relates to algorithms for improved optimization of parameters for use in prediction models that require optimization of adjustable parameters.