The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2010

Filed:

Jan. 08, 2008
Applicant:

Toshiro Kubota, Lewisburg, PA (US);

Inventor:

Toshiro Kubota, Lewisburg, PA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for automatically estimating a measure of a nodule includes providing sliced image volume data comprising at least one marked position of the nodule, extracting a sub-volume from the sliced image volume data that includes the marked position, performing a figure-ground separation to determine a solid foreground of the sub-volume and a non-solid foreground of the sub-volume, determining a seed point corresponding to the nodule from each of the solid foreground and the non-solid foreground, selecting one of the seed point of the solid foreground or the seed point of the non-solid foreground, determining whether the selected seed point is solitary or non-solitary and performing region growing for non-solitary selected seed point, determining a segmentation of the selected seed point, estimating the measure of the nodule corresponding to the segmentation, and outputting the segmentation and an estimate of the measure of the nodule.


Find Patent Forward Citations

Kubota, Toshiro. (2010). Automatic nodule measurements (U.S. Patent No. 7711172). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7711172

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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