The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2010

Filed:

Apr. 11, 2006
Applicants:

Masakazu Suzuki, Kyoto, JP;

Hideki Yoshikawa, Kyoto, JP;

Takahiro Yoshimura, Kyoto, JP;

Makoto Honjo, Kyoto, JP;

Inventors:

Masakazu Suzuki, Kyoto, JP;

Hideki Yoshikawa, Kyoto, JP;

Takahiro Yoshimura, Kyoto, JP;

Makoto Honjo, Kyoto, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

An X-ray detecting section () comprises a first imaging means (S) to generate an X-ray image in response to the X-ray slit beam (B) and a second imaging means (S) to generate an X-ray image in response to the X-ray broad beam (BB). The radiography apparatus (M) displays a first X-ray image generated by the X-ray slit beam (B) and said first imaging means (S), specifies a desired interested area (R) on the first X-ray image, and generates a predetermined sectional image as a second X-ray image by using the X-ray broad beam (BB) and the second imaging means (S) with respect to the specified interested area (R).


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