The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2010

Filed:

Nov. 06, 2007
Applicants:

Tae-wook Kim, Suwon-si, KR;

Choong-yul Cha, Yongin-si, KR;

Jae-sup Lee, Yongin-si, KR;

Kang-yoon Lee, Seoul, KR;

Inventors:

Tae-wook Kim, Suwon-si, KR;

Choong-yul Cha, Yongin-si, KR;

Jae-sup Lee, Yongin-si, KR;

Kang-yoon Lee, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G04F 8/00 (2006.01); G04F 10/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A high resolution time detecting apparatus using interpolation and a time detecting method using the same are provided. The time detecting apparatus includes a delayer which generates delayed signals by sequentially delaying a reference signal using a plurality of delay elements, a latch unit which outputs latch signals using the delayed signals, and an interpolation unit which outputs interpolated signals using input and output signals of the delay elements. As a result, a high resolution TDC using an interpolation and a time detecting method using the same provide improved performance of digital PLL, high resolution digital signal output at a low power consumption, and controlled circuit size.


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