The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2010
Filed:
Aug. 18, 2004
Timothée Pol Jean Toury, Tournes, FR;
Joseph Zyss, Sceaux, FR;
Timothée Pol Jean Toury, Tournes, FR;
Joseph Zyss, Sceaux, FR;
Ecole Normale Superieure de Cachan, Cachan, FR;
Centre National de la Recherche Scientifique—CNRS, Paris, FR;
Abstract
The invention relates to a device useful for non-invasive detection of the properties of a medium by means of interferometry. The device comprises an optical source which is used for illuminating a zone of the medium that is to be probed with a light beam, and an interferometer for splitting the light beam into a reference beam and a probe beam. The interferometer has a cutoff frequency for the automatic control of respective path lengths of the reference beam and of the probe beam. The device also comprises scanning means which, together with the probe beam, are used to scan the zone to be probed at an image acquisition frequency greater than the cutoff frequency.