The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2010

Filed:

Jun. 05, 2007
Applicant:

Hyung-soo Kim, Suwon-si, KR;

Inventor:

Hyung-soo Kim, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 2/47 (2006.01); B41J 27/00 (2006.01); G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A light scanning unit includes: a light source generating and irradiating at least one beam corresponding to an image signal; a beam deflector deflecting and scanning the beam irradiated by the light source; and an f-θ lens forming an image from the beam deflected by the beam deflector onto a surface to be scanned, the f-θ lens being provided as one lens and satisfies the following equation (2): where SAGis Z value of an incident surface of the f-θ lens, which faces the beam deflector, SAGis Z value of the exit surface of the f-θ lens, which faces the surface to be scanned, based on an XYZ coordinate system in which a main scanning plane is a Y-Z plane and a sub-scanning plane is an X-Z plane, and dis a center thickness of the f-θ lens.


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