The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2010
Filed:
Jan. 02, 2008
Giuseppe LA Rosa, Fishkill, NY (US);
Kevin Kolvenbach, Walden, NY (US);
Ping-chuan Wang, Hopewell Junction, NY (US);
Stephen D. Wyatt, Jericho, VT (US);
Giuseppe La Rosa, Fishkill, NY (US);
Kevin Kolvenbach, Walden, NY (US);
Ping-Chuan Wang, Hopewell Junction, NY (US);
Stephen D. Wyatt, Jericho, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and apparatus for dynamic characterization of reliability wearout mechanisms is disclosed. The system comprises an integrated circuit incorporating a device under test to be measured, structure for inputting a waveform to the device under test for a first predetermined time interval, structure for disabling the inputting of the waveform to the device under test, structure for measuring one or more fundamental parameters of the device under test after a second predetermined time interval, and structure for calculating an aging estimate of the device under test without the influence of recovery effect based on the one or more measured fundamental parameters. The time between stressing and measurement is precisely controlled, providing for repeatable experiments, and serves to minimize measurement error caused by recovery effects.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile