The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2010
Filed:
Nov. 23, 2005
Applicants:
Marcel Pelgrom, Helmond, NL;
Hendricus J M Veendrick, Heeze, NL;
Inventors:
Marcel Pelgrom, Helmond, NL;
Hendricus J M Veendrick, Heeze, NL;
Assignee:
NXP B.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
An integrated circuit () comprises a monitor (M, M, M) operable to produce monitor data in dependence upon a measured parameter of the integrated circuit (); and a self test controller () connected to receive monitor data from the monitor (M, M, M). The self-test controller is also operable to output self test data from the integrated circuit. The monitor includes an output shift register (SR, SR, SR) and is operable to output monitor data through the shift register (SR, SR, SR). Such a system enables simplified communication of system self test results on an integrated circuit.