The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2010

Filed:

Jul. 07, 2006
Applicant:

Andy Sturman, San Diego, CA (US);

Inventor:

Andy Sturman, San Diego, CA (US);

Assignee:

FCC, LLC, Boca Raton, FL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method is provided for reading a test strip by measuring the light intensity incident on a photodiode. The method may include reverse biasing the photodiode, measuring a time required to charge a capacitor using current generated by the photodiode, and using the time required to charge the capacitor to determine a condition of the test strip. The system may include a photodiode being reverse biased and a capacitor being charged by the reversed biased photodiode. The length of time to charge the capacitor may be proportional to the light intensity incident on the photodiode and may be used to determine a condition of the test strip.


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