The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2010

Filed:

Jun. 03, 2005
Applicants:

Yuk Ming Dennis Lo, Kowloon, HK;

Rossa Wai Kwun Chiu, Hong Kong, HK;

Stephen Siu Chung Chim, Wan Chai, HK;

Yu-kwan Tong, Hong Kong, HK;

Chunming Ding, Shatin, HK;

Inventors:

Yuk Ming Dennis Lo, Kowloon, HK;

Rossa Wai Kwun Chiu, Hong Kong, HK;

Stephen Siu Chung Chim, Wan Chai, HK;

Yu-kwan Tong, Hong Kong, HK;

Chunming Ding, Shatin, HK;

Assignee:

The Chinese University of Hong Kong, Shatin, New Territories, Hong Kong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C07H 21/04 (2006.01); C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to new methods for diagnosing a pregnancy-associated disorder by analyzing fetal DNA present in the mother's blood. More specifically, this invention relies on the discovery that the maspin gene is differentially methylated in fetal DNA and in maternal DNA and provides these new diagnostic methods, which distinguish fetal DNA from maternal DNA and detect prenatal disorders based on abnormalities in fetal DNA level and methylation status.


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