The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2010

Filed:

Aug. 24, 2006
Applicants:

Angela L. Petroski, Crawfordsville, IN (US);

Samuel A. Truncone, Crawfordsville, IN (US);

James Macey, Arcadia, MI (US);

Hualin Jiang, Granger, IN (US);

Inventors:

Angela L. Petroski, Crawfordsville, IN (US);

Samuel A. Truncone, Crawfordsville, IN (US);

James Macey, Arcadia, MI (US);

Hualin Jiang, Granger, IN (US);

Assignee:

Raytech Composites, Inc., Crawfordsville, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D21F 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A process and apparatus for making die-dried friction wafers collects friction particulates in a mold defining a wafer. The mold includes at least one perforate wall portion against which an aqueous slurry including the particulates is passed to form at least one layer on the wall as the particulates collect in the mold. The collection is dried followed by curing, and may be cured in the mold by heating.


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