The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2010
Filed:
Jun. 30, 2004
Nicolai Kosche, San Francisco, CA (US);
Robert E. Cypher, Saratoga, CA (US);
Mario I. Wolczko, San Carlos, CA (US);
John P. Petry, San Diego, CA (US);
Adam R. Talcott, San Jose, CA (US);
Nicolai Kosche, San Francisco, CA (US);
Robert E. Cypher, Saratoga, CA (US);
Mario I. Wolczko, San Carlos, CA (US);
John P. Petry, San Diego, CA (US);
Adam R. Talcott, San Jose, CA (US);
Oracle America, Inc., Redwood Shores, CA (US);
Abstract
Associating data source information with sampled runtime events allows identification of system components related to the sampled runtime events. Code can be optimized from the perspective of system components and for various architectures. A system provides a data source indication. The system associates the data source indication with a corresponding instruction instance. The instruction instance is related to a sampled runtime event, and the sampled runtime event is associated with the data source indication. The data source information and associated sampled runtime event can be supplied for profiling code.