The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2010

Filed:

Oct. 17, 2005
Applicants:

David L. Schmidt, Cary, NC (US);

Theodore F. Rivera, Raleigh, NC (US);

Scott A. Will, Wake Forest, NC (US);

Inventors:

David L. Schmidt, Cary, NC (US);

Theodore F. Rivera, Raleigh, NC (US);

Scott A. Will, Wake Forest, NC (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for autonomically prioritizing software defects may include applying at least one static analysis tool to a body of source code to generate a report in response to any perceived defects. The method may also include performing a delta analysis on a group of data that may include the report, a previously generated report, and one of a default priority scheme and a previously generated priority list to generate a refined priority list of types of software defects.


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