The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2010

Filed:

May. 11, 2006
Applicants:

Yixin Diao, White Plains, NY (US);

Sujay Parekh, New York, NY (US);

Maheswaran Surendra, Croton-on-Hudson, NY (US);

Ronghua Zhang, Palo Alto, CA (US);

Inventors:

Yixin Diao, White Plains, NY (US);

Sujay Parekh, New York, NY (US);

Maheswaran Surendra, Croton-on-Hudson, NY (US);

Ronghua Zhang, Palo Alto, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 13/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques for managing feedback control systems are provided. By way of example, a method of controlling performance of a managed system by a controller includes the following steps/operations. The controller issues a control value to the managed system to affect a performance of the managed system. The controller maintains a measurement time period having a variable start time within which the performance of the managed system is measured, such that the control value is given time to take effect on the managed system and a performance metric fed back to the controller from the managed system reflects the effect of the control value on the managed system.


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