The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2010

Filed:

Nov. 22, 2004
Applicants:

Ashish Mittal, Sunnyvale, CA (US);

Edward Shaw-lee Suen, San Francisco, CA (US);

Inventors:

Ashish Mittal, Sunnyvale, CA (US);

Edward Shaw-Lee Suen, San Francisco, CA (US);

Assignee:

Siebel Systems, Inc., San Mateo, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for performing a distinct count metric by utilizing aggregate navigation. For a distinct count query of an identifier of a detail table, where the query specifies zero or more restrictions, an aggregate table associated with the detail table is identified. It is then determined whether the aggregate table contains the identifier that is being distinct counted, and if so, whether the identifier is different in every row of the aggregate table. If it is, then the rows of the aggregate table that satisfy the specified restrictions are plain counted to obtain a result for the distinct count query. If the identifier is not different in every row of the aggregate table, a distinct count operation is performed on the rows of the aggregate table that satisfy the specified restrictions to obtain a result for the distinct count query.


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