The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2010
Filed:
Apr. 19, 2007
Douglas M. Baney, Los Altos, CA (US);
John C. Eidson, Palo Alto, CA (US);
Douglas M. Baney, Los Altos, CA (US);
John C. Eidson, Palo Alto, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
Test instruments constituting an automatic test system are characterized in terms of execution time data. The execution time data is composed of a set of execution times. Each of the execution times is the time required for the test instrument to perform a respective testing operation. The test instruments additionally have the ability to communicate their respective execution time data to such recipients as others of the test instruments, the system controller and recipients outside the automatic test system. Additionally, such test instruments have the ability to communicate test results to at least one other of the test instruments and the ability to process test results received from at least one other of the test instruments. Such characterization, communication and processing allows a system integrator to devise execution time-dependent test programs as part of a test suite that allows test throughput to be maximized.