The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2010
Filed:
May. 31, 2007
Cheng-yung Teng, Taipei County, TW;
Li-jieu Hsu, Taipei, TW;
Jie-wei Huang, Taipei County, TW;
Huei-huang Chen, Taipei County, TW;
Cheng-Yung Teng, Taipei County, TW;
Li-Jieu Hsu, Taipei, TW;
Jie-Wei Huang, Taipei County, TW;
Huei-Huang Chen, Taipei County, TW;
Princeton Technology Corporation, Taipei County, TW;
Abstract
The invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a precision measurement unit, a signal transformation module, and a microprocessor. The precision measurement unit is coupled to the device under test for providing a testing signal and receiving a measurement signal generated according to the testing signal. The signal transformation module is coupled to the precision measurement unit for receiving the measurement signal and transforming the measurement signal to a signal measurement result according to a predetermined manner. The microprocessor is coupled to the precision measurement unit and the signal transformation module for examining the signal measurement result to determine a test result for the device under test.