The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2010

Filed:

Aug. 22, 2003
Applicants:

Chieko Aizawa, Hachioji, JP;

Fumiyuki Onoda, Tama, JP;

Sumihiro Uchimura, Sagamihara, JP;

Akira Taniguchi, Hachioji, JP;

Inventors:

Chieko Aizawa, Hachioji, JP;

Fumiyuki Onoda, Tama, JP;

Sumihiro Uchimura, Sagamihara, JP;

Akira Taniguchi, Hachioji, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01);
U.S. Cl.
CPC ...
Abstract

Position detecting elements are disposed in an endoscope insertion portion at predetermined intervals. Even when the endoscope insertion portion is bent, position data representing the detected positions of the elements is used to infer or detect the shape of the insertion portion. A virtual element is disposed between adjoining elements so that a predetermined condition will be met. Position data of the virtual element is used together with the actually detected position data in order to interpolate data for the purpose of detecting the shape of the insertion portion. Consequently, as if a larger number of elements were disposed, the shape of the insertion portion can be detected highly precisely.


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