The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2010
Filed:
Oct. 02, 2001
Kevin Kreeger, Sunnyvale, CA (US);
Sarang Lakare, Selden, NY (US);
Zhenrong Liang, Stony Brook, NY (US);
Mark R. Wax, Greenlawn, NY (US);
Ingmar Bitter, Rockville, MD (US);
Frank Dachille, Amityville, NY (US);
Dongqing Chen, Port Jefferson Station, NY (US);
Arie E. Kaufman, Plainview, NY (US);
Kevin Kreeger, Sunnyvale, CA (US);
Sarang Lakare, Selden, NY (US);
Zhenrong Liang, Stony Brook, NY (US);
Mark R. Wax, Greenlawn, NY (US);
Ingmar Bitter, Rockville, MD (US);
Frank Dachille, Amityville, NY (US);
Dongqing Chen, Port Jefferson Station, NY (US);
Arie E. Kaufman, Plainview, NY (US);
The Research Foundation of State University of New York, Stony Brook, NY (US);
Abstract
Virtual navigation () and examination of virtual objects are enhanced using methods of insuring that an entire surface to be examined has been properly viewed. A user interface (FIG.) identifies regions which have not been subject to examination and provides a mechanism () to route the user to these regions in the 3D display. Virtual examination is further improved by the use of measuring disks () to enhance quantitative measurements such as diameter, distance, volume and angle. Yet another enhancement to the virtual examination of objects is a method of electronic segmentation, or cleaning, which corrects for partial volume effects occurring in an object.