The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2010
Filed:
Jun. 03, 2005
Xianhua Wang, Beijing, CN;
Guoliang Huang, Beijing, CN;
Jing Cheng, Beijing, CN;
Hong Zhang, Beijing, CN;
Taishan Gao, Beijing, CN;
Xianhua Wang, Beijing, CN;
Guoliang Huang, Beijing, CN;
Jing Cheng, Beijing, CN;
Hong Zhang, Beijing, CN;
Taishan Gao, Beijing, CN;
Capitalbio Corporation, Beijing, CN;
Abstract
The invention provides a novel optical system for use in a microarray scanner, comprising an aperture-containing reflecting mirror comprising an aperture and a reflecting surface. The aperture of the aperture-containing reflecting mirror allows an excitation light to pass through, and the reflecting surface of the aperture-containing reflecting mirror allows emission light from a microarray to be reflected. The optical system may also comprises various other components such as laser generators, beam splitter, reflecting mirrors, excitation and emission light filters, excitation and emission objective lens, pinhole, and detector. The optical system described herein has high efficiency, high sensitivity, low background noise, structurally simple, and high versatility.