The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7706060 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 27, 2010

Filed:

Sep. 13, 2006
Applicants:

Hideo Mogami, Hamamatsu, JP;

Yohei Sato, Yokohama, JP;

Yutaka Kazoe, Yokohama, JP;

Inventors:

Hideo Mogami, Hamamatsu, JP;

Yohei Sato, Yokohama, JP;

Yutaka Kazoe, Yokohama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a microscopic cell observation and inspection system that uses a total internal reflection cell illuminator that is capable of freely changing an observation position without recourse to any special slide glass, makes sure high SN-ratio observation and facilitates sample manipulation, thereby making high-sensitivity, fast detection of a lot of cell reactions on the same slide glass. While, in response to a command from personal computer (), step motors () are driven to sequentially scan observation positions of cell sample (S) on slide glass (), one of shutter units () and () is closed and the other is opened at high speed, whereby either one of illumination optical paths for a TIRF microscope and a drop fluorescence microscope is selected to illuminate cell sample (S) on that observation position. When the drop fluorescence microscope is chosen, filter unit () is driven to choose the wavelength of excitation light from drop fluorescence illumination light source (), so that observation and inspection of cell sample (S) under the TIRF microscope and drop fluorescence microscope can be implemented in an alternate fast switchover way.


Find Patent Forward Citations

Mogami, Hideo. (2010). Microscopic cell observation and inspection system using a plurality of observation methods (U.S. Patent No. 7706060). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7706060

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