The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2010
Filed:
Oct. 26, 2007
Mark Summa, Painted Post, NY (US);
Peter Gerard Wigley, Corning, NY (US);
Aravanan Gurusami, Painted Post, NY (US);
Ghang-ho Lee, Painted Post, NY (US);
Douglas Llewellyn Butler, Painted Post, NY (US);
Robert David Paul Ridding, Horseheads, NY (US);
Timothy Kent Zahnley, Spencer, NY (US);
Mark Summa, Painted Post, NY (US);
Peter Gerard Wigley, Corning, NY (US);
Aravanan Gurusami, Painted Post, NY (US);
Ghang-Ho Lee, Painted Post, NY (US);
Douglas Llewellyn Butler, Painted Post, NY (US);
Robert David Paul Ridding, Horseheads, NY (US);
Timothy Kent Zahnley, Spencer, NY (US);
Oclaro North America, Inc., San Jose, CA (US);
Abstract
Described is a method for designing individual stages of a multiple cascaded etalon TDC device to allow continuous thermo-optic tuning over a desired range without inducing incremental signal distortion due to uncontrolled and unpredictable dispersion of the TDC during tuning. This allows the signal to transmit without encountering periods of incremental distortion or dark spots. The method includes prior knowledge of each etalon stage, after full assembly, for spectral group delay profile as a function of temperature through modeling and/or characterization. Characterization can account for performance variations that are due to allowed manufacturing tolerances.