The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2010

Filed:

Feb. 06, 2006
Applicants:

Mau-song Chou, Rancho Palos Verdes, CA (US);

Jonathan W. Arenberg, Santa Monica, CA (US);

Mark A. Menard, Chino Hills, CA (US);

Inventors:

Mau-Song Chou, Rancho Palos Verdes, CA (US);

Jonathan W. Arenberg, Santa Monica, CA (US);

Mark A. Menard, Chino Hills, CA (US);

Assignee:

Northrop Grumman Corporation, Los Angeles, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G02F 1/01 (2006.01);
U.S. Cl.
CPC ...
Abstract

A technique for providing high-contrast images of defects in solar cells and solar panels, by illuminating each cell under inspection with broadband infrared radiation, and then forming an image of radiation that is secularly reflected from the cell. Multi-junction solar cells have a metal backing layer that secularly reflects the illumination back into an appropriately positioned and aligned camera, selected to be sensitive to infrared wavelengths at which the solar cell materials are relatively transparent.


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