The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2010
Filed:
Jun. 10, 2008
Applicants:
Byron W. Tietjen, Baldwinsville, NY (US);
Michael J. Walsh, Baldwinsville, NY (US);
Inventors:
Byron W. Tietjen, Baldwinsville, NY (US);
Michael J. Walsh, Baldwinsville, NY (US);
Assignee:
Lockheed Martin Corporation, Bethesda, MD (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system comprising an radio frequency (RF) signal input; a plurality of time-skewed, undersampled analog to digital converters (ADCs); a plurality of complex finite input response (FIR) filters in parallel, wherein each complex FIR filter receives the output beam and/or band provided by the plurality of ADCs and generates a corresponding output beam of a given frequency.
Tietjen, Byron. (2010). System and method for wideband direct sampling and beamforming using complex analog to digital converter (U.S. Patent No. 7705761). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7705761
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile