The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2010
Filed:
Nov. 21, 2007
Nahum Guzik, Palo Alto, CA (US);
Vladislav Klimov, San Jose, CA (US);
Semen Volfbeyn, Milpitas, CA (US);
Nahum Guzik, Palo Alto, CA (US);
Vladislav Klimov, San Jose, CA (US);
Semen Volfbeyn, Milpitas, CA (US);
Guzik Technical Enterprises, Mountain View, CA (US);
Abstract
Disclosed is a method of measuring frequency distortions characteristics of a device under test, the device configured convert an input signal in an input frequency range to an output signal in a different output frequency range. The method includes, for each test frequency f, where i=1, . . . , N and N a positive integer, in a selected frequency range, providing a corresponding test signal with multiple frequency components having a measurement component with a frequency f, a first reference component with a frequency fand a second reference component with a frequency f; inputting the test signals into the device under test; measuring output test signals at the output of the device under test corresponding to the input test signals; and determining, for each test frequency f, information representative of frequency distortions based on the corresponding input test signal and the corresponding output test signal.