The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2010

Filed:

Feb. 19, 2008
Applicants:

Young Joo Kim, Daejeon, KR;

Bong Young Ahn, Daejeon, KR;

Seung Seok Lee, Daejeon, KR;

Young Gil Kim, Daejeon, KR;

Dong Jin Yoon, Daejeon, KR;

Inventors:

Young Joo Kim, Daejeon, KR;

Bong Young Ahn, Daejeon, KR;

Seung Seok Lee, Daejeon, KR;

Young Gil Kim, Daejeon, KR;

Dong Jin Yoon, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/82 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sensor for detecting surface defects of a metal tube solves a problem of a conventional eddy current probe in that it is difficult to detect a crack in the circumferential direction of a metal tube. The sensor includes a plurality of coils wound at a predetermined inclined angle. The plurality of coils is inserted into the inside of a metal tube. Alternating current is applied to the coils to measure a change in impedance of the coils due to a change in an eddy current generated in the metal tube, thus detecting a surface defect of the metal tube.


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