The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2010
Filed:
Dec. 08, 2005
Xiao-dong Xiang, Danville, CA (US);
Haitao Yang, San Jose, CA (US);
Gang Wang, San Jose, CA (US);
Jonathan Melman, Redwood City, CA (US);
Xiao-Dong Xiang, Danville, CA (US);
Haitao Yang, San Jose, CA (US);
Gang Wang, San Jose, CA (US);
Jonathan Melman, Redwood City, CA (US);
Intematix Corporation, Fremont, CA (US);
Abstract
High throughput screening of catalyst libraries may be performed using spin resonance techniques, and an evanescent wave probe developed by the present inventors. The probe may operate using either nuclear magnetic resonance or electron spin resonance techniques. In one configuration, a scanning evanescent wave spin resonance probe is used in conjunction with a library of catalysts or other materials, and localized detection of spin resonance is carried out at each library address. In another configuration, the evanescent wave probe is used in a micro-reactor array assay.