The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2010
Filed:
Apr. 13, 2007
Applicants:
John P. Mead, Longmont, CO (US);
Bahjat Zafer, Cupertino, CA (US);
Inventors:
John P. Mead, Longmont, CO (US);
Bahjat Zafer, Cupertino, CA (US);
Assignee:
Broadcom Corporation, Irvine, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G06F 11/00 (2006.01); G11B 27/36 (2006.01); G11B 5/09 (2006.01);
U.S. Cl.
CPC ...
Abstract
A technique to detect defects when reading a defect scan pattern stored on a disk in which the detected defects are processed differently depending on which region of a sector the defect is resident. In one implementation, a mask is used to identify the defects of different regions. By differentiating different regions within the sector for defect scan, sync mark and preamble fields may be treated as critical regions so that different defect scan properties may be attributed when performing the defect scan.