The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 2010

Filed:

Jun. 30, 2004
Applicants:

Gregory F. Grohoski, Austin, TX (US);

Paul J. Jordan, Austin, TX (US);

Yue Chang, Cambridge, MA (US);

Inventors:

Gregory F. Grohoski, Austin, TX (US);

Paul J. Jordan, Austin, TX (US);

Yue Chang, Cambridge, MA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/38 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and mechanism for monitoring events in a processing system. A performance monitoring mechanism includes is configured to store a count of events in an event counter. Periodically, the count stored in the event counter is updated to a new count. If the new count equals a predetermined value, an indication that the count equals the predetermined value is conveyed. If the new count does not equal the predetermined value, but is within a given epsilon of the predetermined value and the occurrence of a corresponding event is detected, an indication that the count equals the predetermined value is conveyed. The mechanism is further configured to suppress event counts which correspond to mis-speculations.


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