The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2010
Filed:
Jun. 22, 2005
Wade Allen, Efland, NC (US);
Paolo Deidda, Rome, IT;
David Anthony Fresquez, Cary, NC (US);
Antonio Perrone, Rome, IT;
Rosalind Radcliffe, Durham, NC (US);
Wade Allen, Efland, NC (US);
Paolo Deidda, Rome, IT;
David Anthony Fresquez, Cary, NC (US);
Antonio Perrone, Rome, IT;
Rosalind Radcliffe, Durham, NC (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
For monitoring a data processing system, a sequence of critical conditions with increasing severity indexes is defined. Each critical condition is detected when a corresponding state parameter exceeds a threshold value with a predefined persistence over time. The persistence may be specified by a minimum number of repeated occurrences of this event, with a maximum number of consecutive non-occurrences that are allowed between them. Whenever critical conditions are detected, the monitoring application retrieves the severity index of the last detected critical condition with the highest severity index, and calculates an incremental index indicative of how closely the state parameter is approaching the next critical condition. An indicator of the health of the system may be generated by subtracting the severity index of the last critical condition plus the incremental index from an optimal value.