The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 2010

Filed:

Apr. 25, 2005
Applicants:

Cheng-tang Wu, Livermore, CA (US);

Yong Guo, San Ramon, CA (US);

Inventors:

Cheng-Tang Wu, Livermore, CA (US);

Yong Guo, San Ramon, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/60 (2006.01); G06F 17/10 (2006.01); G06G 7/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, system and computer program product pertained to adaptive discretization refinement of shell structure is disclosed. The adaptive mesh-free model is based on a technique for dividing the critical area into a finer model. The present invention is a method for enabling adaptive mesh-free shell structure in a time-domain analysis, the method comprises: defining the mesh-free shell structure by a structural geometry description file including a plurality of nodes and a reference 3-D mesh, which includes a plurality of shell elements, mapping the 3-D reference mesh into a 2-D parametric plane, wherein the 2-D parametric mesh includes a plurality of integration cells corresponding to the plurality of shell elements, solving structural responses at current solution cycle using mesh-free mathematical approximations pertaining to each of the plurality of integration cells, performing adaptive discretization refinement for the plurality of the integration cells.


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