The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2010
Filed:
Jun. 29, 2005
Saad Ahmed Sirohey, Pewaukee, WI (US);
David Charles Mack, Waukesha, WI (US);
Peter Lehel, Oconomowoc, WI (US);
Toan Thanh Le, Germantown, WI (US);
Kelly Ann Mohr, New Berlin, WI (US);
Saad Ahmed Sirohey, Pewaukee, WI (US);
David Charles Mack, Waukesha, WI (US);
Peter Lehel, Oconomowoc, WI (US);
Toan Thanh Le, Germantown, WI (US);
Kelly Ann Mohr, New Berlin, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A computer-implemented method for quantifying an object in a larger structure using a reconstructed image obtained from an imaging apparatus includes identifying an object boundary in a region of interest of the image and a region of exclusion, and determining a mean value of intensity in a neighborhood of the object to estimate a background value, excluding the region of exclusion. The method further includes determining an interior region, a transition region, and a background region of the object using the object boundary and a transfer function of the imaging apparatus, and determining and displaying a measure of object quantification utilizing intensities of at least one of the determined interior region or the transition region a method for quantifying an object in a larger structure using a reconstructed image obtained from an imaging apparatus.