The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2010
Filed:
Jul. 19, 2006
Yun-young Kim, Suwon-si, KR;
Jae-ho Roh, Seoul, KR;
Yun-young Kim, Suwon-si, KR;
Jae-ho Roh, Seoul, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A sampling frequency offset estimation apparatus and method to be applied to an OFDM (orthogonal frequency division multiplexing) system are provided. The apparatus includes an ADC (analog-to-digital converter) sampling a received signal based on a predetermined sampling frequency; a FFT (Fast Fourier Transform) unit transforming the sampled received signal into a frequency domain; a phase calculator calculating phase shifts of pilot subcarriers of the sampled received signal which has been transformed into the frequency domain; a determiner calculating phase shift reaching times at which samples of the pilot subcarriers shift due to the phase shift; a time offset calculator calculating a sampling time offset using the pilot subcarriers, and a frequency offset calculator calculating a sampling frequency offset based on the phase shift reaching times and the sampling time offset.